Zanoni, EnricoEnricoZanoniMeneghini, MatteoMatteoMeneghiniChini, AlessandroAlessandroChiniMarcon, DenisDenisMarconMeneghesso, GaudenzioGaudenzioMeneghesso2021-10-212021-10-2120130018-9383https://imec-publications.be/handle/20.500.12860/23434AlGaNGaN-based HEMTs failure physics and reliability: mechanisms affecting gate edge and Schottky junctionJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6564457