New method for accurate determination of the electric-field enhancement in junctions - theoretical model and application to STI diodes with high fields

Czerwinski, A.A.CzerwinskiSimoen, EddyEddySimoenPoyai, AmpornAmpornPoyaiClaeys, CorCorClaeys2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6166New method for accurate determination of the electric-field enhancement in junctions - theoretical model and application to STI diodes with high fieldsProceedings paper