Noltsis, MichalisMichalisNoltsisMaragkoudaki, EleniEleniMaragkoudakiRodopoulos, DimitriosDimitriosRodopoulosCatthoor, FranckyFranckyCatthoorSoudris, DimitriosDimitriosSoudris2021-10-272021-10-2720190167-9260https://imec-publications.be/handle/20.500.12860/33678Failure probability of a FinFET-based SRAM cell utilizing the most probable failure pointJournal articlehttps://doi.org/10.1016/j.vlsi.2018.03.016