Witvrouw, AnnAnnWitvrouwVan Dooren, SofieSofieVan DoorenWouters, DirkDirkWoutersVan Dievel, MarcMarcVan DievelMaex, KarenKarenMaex2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1661The isocurrent test: a promising tool for wafer-level evaluation of the interconnect reliabilityJournal article