Analysis of trap-assisted tunneling in vertical Si homo-junction and SiGe hetero-junction tunnel-FETs

Vandooren, AnneAnneVandoorenRooyackers, RitaRitaRooyackersLeonelli, DanieleDanieleLeonelliHikavyy, AndriyAndriyHikavyyDevriendt, KatiaKatiaDevriendtDemand, MarcMarcDemandLoo, RogerRogerLooGroeseneken, GuidoGuidoGroesenekenHuyghebaert, CedricCedricHuyghebaert2021-10-212021-10-2120130038-1101https://imec-publications.be/handle/20.500.12860/23295Analysis of trap-assisted tunneling in vertical Si homo-junction and SiGe hetero-junction tunnel-FETsJournal articlehttp://www.sciencedirect.com/science/article/pii/S0038110113000397