Extensive reliability investigation of a-VMCO nonfilamentary RRAM: relaxation, retention and key differences to filamentary switching

Subhechha, SubhaliSubhaliSubhechhaGovoreanu, BogdanBogdanGovoreanuChen, YangyinYangyinChenClima, SergiuSergiuClimaDe Meyer, KristinKristinDe MeyerVan Houdt, JanJanVan HoudtJurczak, GosiaGosiaJurczak2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/27359Extensive reliability investigation of a-VMCO nonfilamentary RRAM: relaxation, retention and key differences to filamentary switchingProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7574568