Study of random telegraph noise in UTBOX silicon-on-insulator nMOSFETs

Li, Chi-KangChi-KangLiFang, WenWenFangSimoen, EddyEddySimoenAoulaiche, MarcMarcAoulaicheWu, Yuh-RennYuh-RennWuLuo, JunJunLuoZhao, ChaoChaoZhaoClaeys, CorCorClaeys2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24121Study of random telegraph noise in UTBOX silicon-on-insulator nMOSFETsProceedings paperhttp://ecst.ecsdl.org/content/60/1/109.abstract