Hot carrier stress and breakdown impact on high-frequency MOSFET analog performance

Pantisano, LuigiLuigiPantisanoSchreurs, DominiqueDominiqueSchreursKaczer, BenBenKaczerSimoen, EddyEddySimoenGroeseneken, GuidoGuidoGroeseneken2021-10-152021-10-152004-10https://imec-publications.be/handle/20.500.12860/9390Hot carrier stress and breakdown impact on high-frequency MOSFET analog performanceProceedings paper