A low-frequency noise study of state-of-the-art silicon n+p junction diodes

Simoen, EddyEddySimoenVanhellemont, JanJanVanhellemontClaeys, CorCorClaeysBosman, GijsGijsBosman2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/883A low-frequency noise study of state-of-the-art silicon n+p junction diodesProceedings paper