Sharma, PrateekPrateekSharmaTyaginov, StanislavStanislavTyaginovRauch, Stewart E. IIIStewart E. IIIRauchFranco, JacopoJacopoFrancoMakarov, AlexanderAlexanderMakarovVexler, Mikhail I.Mikhail I.VexlerKaczer, BenBenKaczerGrasser, TiborTiborGrasser2021-10-242021-10-2420170741-3106https://imec-publications.be/handle/20.500.12860/29422Hot-carrier degradation modeling of decananometer nMOSFETs using the drift-diffusion approachJournal articlehttp://ieeexplore.ieee.org/document/7801021/