Atom column detection from STEM images using the maximum a posteriori probability rule

Fatermans, J.J.Fatermansden Dekker, A.J.A.J.den DekkerO'Leary, C.M.C.M.O'LearyNellist, P.D.P.D.NellistVan Aert, S.S.Van Aert2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/32950Atom column detection from STEM images using the maximum a posteriori probability ruleMeeting abstracthttps://visielab.uantwerpen.be/publications/atom-column-detection-stem-images-using-maximum-posteriori-probability-rule