Franco, JacopoJacopoFrancoKaczer, BenBenKaczerMitard, JeromeJeromeMitardToledano Luque, MariaMariaToledano LuqueEneman, GeertGeertEnemanRoussel, PhilippePhilippeRousselCho, Moon JuMoon JuChoKauerauf, ThomasThomasKaueraufGrasser, TiborTiborGrasserWitters, LiesbethLiesbethWittersHellings, GeertGeertHellingsRagnarsson, Lars-AkeLars-AkeRagnarssonHoriguchi, NaotoNaotoHoriguchiHeyns, MarcMarcHeynsGroeseneken, GuidoGuidoGroeseneken2021-10-202021-10-202012-10https://imec-publications.be/handle/20.500.12860/20689Reliability of SiGe channel MOSMeeting abstract