SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors

Martin-Martinez, J.J.Martin-MartinezAmat, E.E.AmatGonzalez, MarioMarioGonzalezVerheyen, PeterPeterVerheyenRooyackers, RitaRitaRooyackersRodriguez, R.R.RodriguezNafria, M.M.NafriaAymerich, X.X.AymerichSimoen, EddyEddySimoen2021-10-182021-10-1820100026-2714https://imec-publications.be/handle/20.500.12860/17593SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistorsJournal article