Loozen, XavierXavierLoozenO'Sullivan, BarryBarryO'SullivanRothschild, AudeAudeRothschildVermang, BartBartVermangJohn, JoachimJoachimJohnGordon, IvanIvanGordon2021-10-182021-10-1820101862-6254https://imec-publications.be/handle/20.500.12860/17530On the choice of the test structure for the electrical characterization of dielectrics for silicon solar cellsJournal articleDOI 10.1002/pssr.201004361