Marek, JurajJurajMarekMikoláek, MiroslavMiroslavMikoláekDrobnŭ, JakubJakubDrobnŭKozarik, JozefJozefKozarikChvála, AleAleChválaGeens, KarenKarenGeensBorga, MatteoMatteoBorgaLiang, HuHuLiangYou, ShuzhenShuzhenYouDecoutere, StefaanStefaanDecoutereStuchlíková, LubicaLubicaStuchlíková2021-10-292021-10-292020https://imec-publications.be/handle/20.500.12860/35545Electrical and DLTS Characterization of Gate Interfaces in GaN-based Trench-gate semi-vertical MOS devicesProceedings paper