Tierno, DavideDavideTiernoVega Gonzalez, VictorVictorVega GonzalezEsposto, SimoneSimoneEspostoCiofi, IvanIvanCiofi2024-03-122023-02-162023-02-172024-03-122023-01-230021-4922WOS:000920624900001https://imec-publications.be/handle/20.500.12860/41102Resistance modeling of short-range connections: impact of current spreadingJournal article10.35848/1347-4065/acad0bWOS:000920624900001Electrical & electronic engineeringinterconnects, 4T, TCAD, Ru, MOL, VHV