Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design

Papanikolaou, AntonisAntonisPapanikolaou2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12671Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system designOral presentation