Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuits

Simoen, EddyEddySimoenMercha, AbdelkarimAbdelkarimMerchaCreten, YbeYbeCretenMerken, PatrickPatrickMerkenDe Moor, PietPietDe MoorPutzeys, JanJanPutzeysClaeys, CorCorClaeysVan Hoof, ChrisChrisVan HoofMohammadzadeh, A.A.MohammadzadehNickson, R.R.Nickson2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/8149Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuitsOral presentation