Eyben, PierrePierreEyben2021-10-212021-10-2120132190-4286https://imec-publications.be/handle/20.500.12860/22326High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices (Editorial)Journal articlehttp://www.beilstein-journals.org/bjnano/single/articleFullText.htm?publicId=2190-4286-4-35