A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays

Grill, AlexanderAlexanderGrillMichl, J.J.MichlDiaz Fortuny, JavierJavierDiaz FortunyBeckers, ArnoutArnoutBeckersBury, ErikErikBuryVaisman Chasin, AdrianAdrianVaisman ChasinGrasser, T.T.GrasserWaltl, M.M.WaltlKaczer, BenBenKaczerDe Greve, KristiaanKristiaanDe Greve2023-11-282023-09-032023-11-282023naWOS:001004185500009https://imec-publications.be/handle/20.500.12860/42455A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor ArraysProceedings paper10.1109/JCS57290.2023.10102937979-8-3503-3252-0WOS:001004185500009