Chen, Shih-HungShih-HungChen2023-04-252023-02-272023-04-2520221541-7026WOS:000922926400183https://imec-publications.be/handle/20.500.12860/41158Advanced CMOS Technology Challenges for Robust ESD DesignMeeting abstract978-1-6654-7950-9WOS:000922926400183