Insertion loss and polarization-dependent loss measurement improvement to enable parallel silicon photonics wafer-level testing

Kim, DaehongDaehongKimDe Coster, JeroenJeroenDe CosterVan Campenhout, JorisJorisVan CampenhoutBan, YoojinYoojinBanVelenis, DimitriosDimitriosVelenisSar, HuseyinHuseyinSarKobbi, HakimHakimKobbiMagdziak, RafalRafalMagdziakKim, YounghyunYounghyunKim2024-12-182024-12-182025-MAR0143-8166WOS:001374933800001https://imec-publications.be/handle/20.500.12860/44991Insertion loss and polarization-dependent loss measurement improvement to enable parallel silicon photonics wafer-level testingJournal article10.1016/j.optlaseng.2024.108742WOS:001374933800001BIREFRINGENCE