Hefyene, N.N.HefyeneAnghel, C.C.AnghelIonescu, A. M.A. M.IonescuFrere, S.S.FrereGillon, R.R.GillonVermandel, MiguelMiguelVermandelBakeroot, BenoitBenoitBakerootDoutrloigne, J.J.Doutrloigne2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5337An experimental approach for bias-dependent drain series resistance evaluation in asymmetric HV MOSFETsProceedings paper