Ohyama, HidenoriHidenoriOhyamaVanhellemont, JanJanVanhellemontTakami, Y.Y.TakamiHayama, KiyoteruKiyoteruHayamaSunaga, H.H.SunagaPoortmans, JefJefPoortmansCaymax, MattyMattyCaymax2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1388Effect of radiation source on the degradation in irradiated Si1-xGex epitaxial devicesJournal article