Bias dependent admittance spectroscopy of thin film solar cells: KF post deposition treatment, accelerated lifetime testing, and their effect on the CVf loss maps

Kohl, ThierryThierryKohlBrammertz, GuyGuyBrammertzde Wild, JessicaJessicade WildBuldu, Dilara GokcenDilara GokcenBulduBirant, GizemGizemBirantMeuris, MarcMarcMeurisPoortmans, JefJefPoortmansVermang, BartBartVermang2022-03-072021-11-022022-03-0720210927-0248WOS:000694775200002https://imec-publications.be/handle/20.500.12860/37561Bias dependent admittance spectroscopy of thin film solar cells: KF post deposition treatment, accelerated lifetime testing, and their effect on the CVf loss mapsJournal article10.1016/j.solmat.2021.111289WOS:000694775200002POSTDEPOSITION TREATMENTGRAIN-BOUNDARIESEFFICIENCYINTERFACEZN(S,O)CU(IN