Gao, ZhanZhanGaoHu, Min-ChunMin-ChunHuBaert, RogierRogierBaertChehab, BilalBilalChehabMalagi, SantoshSantoshMalagiSwenton, JoeJoeSwentonHuisken, JosJosHuiskenGoossens, KeesKeesGoossensMarinissen, Erik JanErik JanMarinissen2021-10-272021-10-272019-11https://imec-publications.be/handle/20.500.12860/33007Application of cell-aware test on an advanced 3nm CMOS technology libraryProceedings paper