Bearda, TwanTwanBeardaWoerlee, P. H.P. H.WoerleeWallinga, H.H.WallingaMertens, PaulPaulMertens2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5046Current-voltage characteristics of gate oxides after hard breakdownProceedings paper