Cano de Andrade, GloriaGloriaCano de AndradeToledano Luque, MariaMariaToledano LuqueFourati, FatmaFatmaFouratiDegraeve, RobinRobinDegraeveMartino, Joao AntonioJoao AntonioMartinoClaeys, CorCorClaeysSimoen, EddyEddySimoenVan den Bosch, GeertGeertVan den BoschVan Houdt, JanJanVan Houdt2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22098RTN assessment of traps in polysilicon cylindrical vertical FETs for NVM applicationMeeting abstract