Jablonski, MichalMichalJablonskiBossuyt, FrederickFrederickBossuytVanfleteren, JanJanVanfleterenVervust, ThomasThomasVervustde Vries, HansHansde Vries2021-10-212021-10-2120130026-2714https://imec-publications.be/handle/20.500.12860/22533Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductorJournal article