Impact of technological aspects, radiation and low-temperature operation on the low-frequency noise behaviour of silicon-on-insulator MOSFETs

Simoen, EddyEddySimoenClaeys, CorCorClaeys2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2141Impact of technological aspects, radiation and low-temperature operation on the low-frequency noise behaviour of silicon-on-insulator MOSFETsJournal article