Effect of source-drain electric field on the Meyer-Neldel energy in organic field effect transistors

Ullah, MujeebMujeebUllahPivrikas, AlmantasAlmantasPivrikasFishchuk, IvanIvanFishchukKadashchuk, AndriyAndriyKadashchukStadler, PeterPeterStadlerSimbrunner, ClementsClementsSimbrunnerSariciftci, SerdarSerdarSariciftciSitter, HelmutHelmutSitter2021-10-192021-10-1920110003-6951https://imec-publications.be/handle/20.500.12860/19927Effect of source-drain electric field on the Meyer-Neldel energy in organic field effect transistorsJournal article