Pavanello, Marcelo AntonioMarcelo AntonioPavanellode Souza, MichellyMichellyde SouzaMartino, Joao MartinoJoao MartinoMartinoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-202021-10-2020120038-1101https://imec-publications.be/handle/20.500.12860/21267Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETsJournal article