Reliability mechanisms and lifetime extrapolation methods for scaled interconnect technologies

Croes, KristofKristofCroesWu, ChenChenWuKocaay, DenizDenizKocaayBoemmels, JuergenJuergenBoemmelsTokei, ZsoltZsoltTokei2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25114Reliability mechanisms and lifetime extrapolation methods for scaled interconnect technologiesProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7325585