Recent insights in CMOS reliability characterization by the use of degradation maps

Bury, ErikErikBuryVaisman Chasin, AdrianAdrianVaisman ChasinKaczer, BenBenKaczerChuang, KentKentChuangFranco, JacopoJacopoFrancoSimicic, MarkoMarkoSimicicWeckx, PieterPieterWeckxLinten, DimitriDimitriLinten2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/30344Recent insights in CMOS reliability characterization by the use of degradation mapsProceedings paperhttps://ieeexplore.ieee.org/document/8565676