A new TDDB reliability prediction methodology accounting for multiple SBD and wear out

Sahhaf, SaharSaharSahhafDegraeve, RobinRobinDegraeveRoussel, PhilippePhilippeRousselKaczer, BenBenKaczerKauerauf, ThomasThomasKaueraufGroeseneken, GuidoGuidoGroeseneken2021-10-182021-10-1820090018-9383https://imec-publications.be/handle/20.500.12860/16149A new TDDB reliability prediction methodology accounting for multiple SBD and wear outJournal article