Arvind, ShikharShikharArvindFallica, RobertoRobertoFallicaBezard, PhilippePhilippeBezardPetersen, JohnJohnPetersenDe Gendt, StefanStefanDe GendtLarsen, Esben W.Esben W.Larsen2025-04-012025-04-0120250734-2101https://imec-publications.be/handle/20.500.12860/45475Correction to: Impact of vacuum ultraviolet photons on ultrathin negative tone resists for extreme ultraviolet lithography during plasma etching (vol 43, 023007, 2025)Journal article correction10.1116/6.0004555WOS:001451261400001