Atomic disorder as an intrinsic source of variability in filamentary RRAM devices

Clima, SergiuSergiuClimaFantini, AndreaAndreaFantiniGoux, LudovicLudovicGouxGovoreanu, BogdanBogdanGovoreanuJurczak, GosiaGosiaJurczakPourtois, GeoffreyGeoffreyPourtois2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/26465Atomic disorder as an intrinsic source of variability in filamentary RRAM devices – ab initio investigationsMeeting abstract