Seijnaeve, JoostJoostSeijnaeveDierickx, BartBartDierickxScheffer, DannyDannySchefferHermans, LouLouHermansHaspeslagh, LucLucHaspeslagh2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1472Cryogenic readout electronics & technology for FIRST's stressed arrayJournal article