Aouichi, AhmedAhmedAouichiYuan, SicongSicongYuanFieback, MoritzMoritzFiebackRao, SiddharthSiddharthRaoKim, WoojinWoojinKimMarinissen, Erik JanErik JanMarinissenCouet, SebastienSebastienCouetTaouil, MottaqiallahMottaqiallahTaouilHamdioui, SaidSaidHamdioui2024-03-212024-01-222024-03-2120231081-7735WOS:001108557200013https://imec-publications.be/handle/20.500.12860/43441Device Aware Diagnosis for Unique Defects in STT-MRAMsProceedings paper10.1109/ATS59501.2023.10317952979-8-3503-0310-0WOS:001108557200013