Impact of temperature and programming method on the data retention of Cu/Al2O3-based conductive-bridge RAM operated at low-current (10 $lA)

Belmonte, AttilioAttilioBelmonteFantini, AndreaAndreaFantiniRedolfi, AugustoAugustoRedolfiHoussa, MichelMichelHoussaJurczak, GosiaGosiaJurczakGoux, LudovicLudovicGoux2021-10-232021-10-2320160038-1101https://imec-publications.be/handle/20.500.12860/26333Impact of temperature and programming method on the data retention of Cu/Al2O3-based conductive-bridge RAM operated at low-current (10 $lA)Journal articlehttp://www.sciencedirect.com/science/article/pii/S003811011630096X