Devulder, WouterWouterDevulderGarbin, DanieleDanieleGarbinClima, SergiuSergiuClimaDonadio, Gabriele LucaGabriele LucaDonadioFantini, AndreaAndreaFantiniGovoreanu, BogdanBogdanGovoreanuDetavernier, ChristopheChristopheDetavernierChen, LarryLarryChenMiller, MichaelMichaelMillerGoux, LudovicLudovicGouxVan Elshocht, SvenSvenVan ElshochtSwerts, JohanJohanSwertsDelhougne, RomainRomainDelhougneKar, Gouri SankarGouri SankarKar2022-11-212022-08-132022-11-142022-11-212022-07-010040-6090WOS:000833546900002https://imec-publications.be/handle/20.500.12860/40257A combinatorial study of SiGeAsTe thin films for application as an Ovonic threshold switch selectorJournal article10.1016/j.tsf.2022.139278WOS:000833546900002Materials sciencechalcogenides, thermal stability, in situ X-ray diffraction, Ovonic threshold switching, selectors