Vishwakarma, KavitaKavitaVishwakarmaLee, KookjinKookjinLeeKruv, AnastasiiaAnastasiiaKruvVaisman Chasin, AdrianAdrianVaisman Chasinvan Setten, MichielMichielvan SettenPashartis, ChristopherChristopherPashartisOkudur, Oguzhan OrkutOguzhan OrkutOkudurGonzalez, MarioMarioGonzalezRassoul, NouredineNouredineRassoulBelmonte, AttilioAttilioBelmonteKaczer, BenBenKaczer2025-06-062025-06-062025-05-151938-1891https://imec-publications.be/handle/20.500.12860/45772Impact of Mechanical Stress on IGZO TFTs: Enhancing PBTI DegradationProceedings paper10.1109/IRPS48204.2025.10983050Indium Gallium Zinc Oxide (IGZO), Thin Film Transistor (TFT), Mechanical stress (MS), Positive Bias Temperature Instability (PBTI), Finite Element Modelling (FEM), trapping