van der Sluis, OlafOlafvan der SluisHsu, Yung-YuYung-YuHsuTimmermans, P H MP H MTimmermansGonzalez, MarioMarioGonzalezHoefnagels, J P MJ P MHoefnagels2021-10-192021-10-1920110022-3727https://imec-publications.be/handle/20.500.12860/19964Stretching-induced interconnect delamination in stretchable electronic circuitsJournal article