Uleckas, A.A.UleckasGaubas, E.E.GaubasRafi, J.M.J.M.RafiChen, J.J.ChenYang, D.D.YangOhyama, H.H.OhyamaSimoen, EddyEddySimoenVanhellemont, J.J.Vanhellemont2021-10-192021-10-1920111662-9779https://imec-publications.be/handle/20.500.12860/19926Carrier lifetime studies in diode structures on Si substrates with and without Ge dopingJournal article