Time dependent anomalous charge loss modeling in flash memories and an accelerated testing procedure

Schuler, FranzFranzSchulerTempel, GeorgGeorgTempelMelzner, H.H.MelznerHendrickx, PaulPaulHendrickxWellekens, DirkDirkWellekensLorenzini, MartinoMartinoLorenziniVan Houdt, JanJanVan Houdt2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5639Time dependent anomalous charge loss modeling in flash memories and an accelerated testing procedureProceedings paper