Van Gestel, DriesDriesVan GestelDogan, PinarPinarDoganGordon, IvanIvanGordonBender, HugoHugoBenderLee, K.Y.K.Y.LeeBeaucarne, GuyGuyBeaucarneGall, StefanStefanGallPoortmans, JefJefPoortmans2021-10-182021-10-1820090921-5107https://imec-publications.be/handle/20.500.12860/16386Investigation of intragrain defects in pc-Si layers obtained by aluminium-induced crystallization: comparison of layers made by low and high temperature epitaxyJournal article10.1016/j.mseb.2009.03.006http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TXF-4VYW1JB-1&_user=799533&_coverDate=03%2F15%2F2009&_alid=927606698&