Afanasiev, ValeriValeriAfanasievDe Stefano, FrancescaFrancescaDe StefanoHoussa, MichelMichelHoussaStesmans, AndreAndreStesmansGoux, LudovicLudovicGouxOpsomer, KarlKarlOpsomerKittl, JorgeJorgeKittlJurczak, GosiaGosiaJurczak2021-10-212021-10-2120130040-6090https://imec-publications.be/handle/20.500.12860/21952Electron barrier height at CuxTe1-x/Al2O3 interfaces of conducting bridgememory stacksJournal article