Procel, Luis MiguelLuis MiguelProcelCrupi, FeliceFeliceCrupiLionel, TrojmanTrojmanLionelFranco, JacopoJacopoFrancoKaczer, BenBenKaczer2021-10-232021-10-2320161530-4388https://imec-publications.be/handle/20.500.12860/27168A defect-centric analysis of the temperature dependence of the channel hot carrier degradation in nMOSFETsJournal articlehttp://ieeexplore.ieee.org/document/7362163/