Eneman, GeertGeertEnemanBrunco, DavidDavidBruncoWitters, LiesbethLiesbethWittersMitard, JeromeJeromeMitardHikavyy, AndriyAndriyHikavyyDe Keersgieter, AnAnDe KeersgieterRoussel, PhilippePhilippeRousselLoo, RogerRogerLooVeloso, AnabelaAnabelaVelosoHoriguchi, NaotoNaotoHoriguchiCollaert, NadineNadineCollaertThean, AaronAaronThean2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23793Impact of stressors in future SiGe-based FinFETs: mobility boost and scalabilityProceedings paperhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6874646