Houssa, MichelMichelHoussaDegraeve, RobinRobinDegraeveKauerauf, ThomasThomasKaueraufAoulaiche, MarcMarcAoulaicheGroeseneken, GuidoGuidoGroesenekenDe Gendt, StefanStefanDe GendtHeyns, MarcMarcHeyns2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10616Reliability issues in high-k based devicesProceedings paper